Setting AR Optical Metrology Standards
Join us at SPIE AR|VR|MR 2025 and Photonics West 2025 to explore the latest in optical metrology and testing.
At AR|VR|MR, visit us at Booth #6222 to learn about our AR/VR test systems, designed to deliver precision and reliability throughout the production process.
You'll also find us at Photonics West 2025, Booth #4119, alongside other innovative Finnish companies in the Finland Pavilion. Discover how our system integration and metrology for nano-optics and smart electronics meet unique customer needs.
Registration for the exhibitions is free. We look forward to seeing you at the OptoFidelity booths!
OptoFidelity Presentations at SPIE 2024
Minimizing stray light and crosstalk in wafer-level image quality measurements
27 January 2025 • 10:30 AM - 10:50 AM PST | Moscone West, Room 3006 (Level 3)
Presentation by Joonas Pylväinen, Product Manager at OptoFidelity.
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Optical metrology for boresight and image quality of AR Projectors
27 January 2025 • 11:10 AM - 11:30 AM PST | Moscone West, Room 3006 (Level 3)
Presentation by Roosa Mäkitalo, Product Owner, leads technical development of augmented reality testing solutions at OptoFidelity.
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Latency and tracking performance measurements in head-mounted displays
27 January 2025 • 5:30 PM - 7:00 PM PST | Moscone West, Lobby, (Level 3)
Poster session by Murat Deveci, director of global sales and business development at OptoFidelity.
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Impact of wafer wedge and layout on AR waveguide image quality
27 January 2025 • 5:30 PM - 7:00 PM PST | Moscone West, Lobby, (Level 3)
Presentation by Joonas Pylväinen, Product Manager at OptoFidelity.
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