Setting AR Optical Metrology Standards
Join us at SPIE AR|VR|MR 2024 as we set the standards for optical metrology testing! Visit our booth #6315 to explore our unique AR metrology systems that redefine the way you measure your waveguides and end products. Our test systems cover the entire process, ensuring the highest levels of quality and precision.
OptoFidelity Presentations at SPIE 2024
Dr. Thomas Kerst, Chief of Metrology
"Improving AR metrology: cost & risk cuts via optical referencing innovation"
Murat Deveci, Director, Global Sales and Business
Poster session: "Accurate characterization of diffractive waveguide gratings"
